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Enhanced Atom Probe Imaging using Generalised Field Evaporation Models

Published online by Cambridge University Press:  30 July 2021

Charles Fletcher ,
Michael Moody ,
Jeroen Scheerder ,
Claudia Fleischmann ,
Brian Geiser  and
Daniel Haley
Charles Fletcher
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Michael Moody
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Jeroen Scheerder
Affiliation:
Imec, Kapeldreef 75, 3001 Leuven, Belgium, Leuven, Vlaams-Brabant, Belgium
Claudia Fleischmann
Affiliation:
Imec, Kapeldreef 75, 3001 Leuven, Belgium, Quantum solid-state physics group, KU Leuven, Celestijnenlaan 200D, 3001 Leuven, Belgium, Belgium
Brian Geiser
Affiliation:
CAMECA Instruments Inc., United States
Daniel Haley
Affiliation:
University of Oxford, England, United Kingdom

Abstract

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Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 404 - 406
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Bas, P. et al. , Appl Surf Sci. 87/88 (1995), p. 298-304.Google Scholar
Gault, B. et al. , Ultramicroscopy. 111 (2011), p. 1619–1624.Google Scholar
Larson, D. J. et al. , Journal of Microscopy. 243 (2011), p. 15–30.CrossRefGoogle Scholar
Beinke, D. et al. , Ultramicroscopy. 165 (2016), p. 34–41.Google Scholar
Rolland, N. et al. , Microsc Microanal. 23 (2017), p. 247–254.CrossRefGoogle Scholar
Beinke, D. et al. , Nanoscale. 12 (2020). p. 2820-2832.CrossRefGoogle Scholar
Fletcher, C. et al. , J. Phys. D: Appl. Phys. 53 (2020) 475303.Google Scholar
Oberdorfer, C. et al. , Materials Characterisation. 146 (2018). p. 324-335.Google Scholar
The authors thank H. Bender, P. Kundu and O. Richard (Imec) for the TEM tomography, and M. Dialameh (Imec) for the APT data shown in Figure 1.Google Scholar
Charles Fletcher acknowledges financial support from CAMECA for this research.Google Scholar