Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 22
STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 604-605
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- Cited by 22
Hybrid Detectors Improved Time-Lapse Confocal Microscopy of PML and 53BP1 Nuclear Body Colocalization in DNA Lesions
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- Published online by Cambridge University Press:
- 15 February 2013, pp. 360-369
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- Cited by 22
Quantitative Modal Determination of Geological Samples Based on X-ray Multielemental Map Acquisition
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- Published online by Cambridge University Press:
- 14 June 2002, pp. 139-149
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- Cited by 22
Stochastic Modeling of Multidimensional Particle Properties Using Parametric Copulas
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- Published online by Cambridge University Press:
- 23 April 2019, pp. 720-734
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- Cited by 22
The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 31 August 2011, pp. 817-826
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- Cited by 22
Refractive Index Imaging of Cells with Variable-Angle Near-Total Internal Reflection (TIR) Microscopy
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- Published online by Cambridge University Press:
- 18 September 2017, pp. 978-988
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- Cited by 22
In-process Precipitation During Laser Additive Manufacturing Investigated by Atom Probe Tomography
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 694-695
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- Cited by 22
Quantitative Strain Mapping Applied to Aberration-Corrected HAADF Images
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- 14 July 2006, pp. 285-294
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- Cited by 22
Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!†
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- 12 August 2016, pp. 735-753
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- Cited by 22
Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 298-299
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- Cited by 22
A Transmission Electron Microscopy Study of the Effect of Interfaces on Bubble Formation in He-Implanted Cu-Nb Multilayers
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- 18 January 2012, pp. 152-161
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- Cited by 22
Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin Films
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- Published online by Cambridge University Press:
- 27 December 2018, pp. 647-656
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- Cited by 22
STOPGAP: A Software Package for Subtomogram Averaging and Refinement
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- Published online by Cambridge University Press:
- 30 July 2020, p. 2516
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- Cited by 22
Specimen Preparation for Cross-Section Atom Probe Analysis
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 1004-1005
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- Cited by 22
“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 566-567
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- Cited by 22
The Role of Microscopy in Understanding Atherosclerotic Lysosomal Lipid Metabolism
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- 31 January 2003, pp. 54-67
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- Cited by 22
Deep Neural Network Enabled Space Group Identification in EBSD
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- 14 May 2020, pp. 447-457
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- Cited by 22
Swept Field Laser Confocal Microscopy for Enhanced Spatial and Temporal Resolution in Live-Cell Imaging
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- 26 July 2012, pp. 753-760
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- Cited by 21
Fast and Simple Specimen Preparation for TEM Studies of Oxide Films Deposited on Silicon Wafers
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- 15 January 2009, pp. 15-19
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- Cited by 21
Electron Correlation Microscopy: A New Technique for Studying Local Atom Dynamics Applied to a Supercooled Liquid
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- 03 June 2015, pp. 1026-1033
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