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STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support

Published online by Cambridge University Press:  25 July 2016

Takeshi Sunaoshi
Affiliation:
Hitachi High-Technologies Corp., Application Development Department, Ibaraki, Japan
Kazutoshi Kaji
Affiliation:
Hitachi High-Technologies Corp., Electron Microscope Systems Design 1st Dept., Ibaraki, Japan
Yoshihisa Orai
Affiliation:
Hitachi High Technologies Corp., Application Development Dept., Kanagawa, Japan
C.T. Schamp
Affiliation:
Hitachi High Technologies America, NSD, Clarksburg, Maryland, USA
Edgar Voelkl
Affiliation:
Hitachi High Technologies America, NSD, Clarksburg, Maryland, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Egerton, R.F. Electron Energy-Loss Spectroscopy in Electron Microscope. Springer, New York.Google Scholar
[2] Suenaga, K., et al., Nature Vol. 468 (2010) 10881090.Google Scholar
[3] Algara-Siller, G., Lehtinen, O., Turchanin, A. & Kaiser, U. (2014). Appl. Phys. Lett. 104 153115.Google Scholar
[4] (The authors wish to thank Dr. Tsuyohiko Fujigaya, Kyushu University for providing the samples.Google Scholar