Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Sunaoshi, Takeshi
Shirai, Manabu
Okada, Satoshi
Kaji, Kazutoshi
and
Voelkl, Edgar
2017.
Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-World?.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
1560.
Demers, Hendrix
Brodusch, Nicolas
and
Gauvin, Raynald
2017.
Low Accelerating Voltage Scanning Transmitted Electron Microscope: Imaging, Diffraction, X-ray Microanalysis, and Electron Energy-Loss Spectroscopy at the Nanoscale.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
528.
Demers, Hendrix
Brodusch, Nicolas
and
Gauvin, Raynald
2017.
High Spatial Resolution Spectroscopy in a FE-SEM: X-ray Microanalysis and Electron Energy-Loss Spectroscopy.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
1044.
Sunaoshi, Takeshi
Shirai, Manabu
Okada, Satoshi
Kaji, Kazutoshi
and
Voelkl, Edgar
2017.
EELS Investigation of Al2O3 at 30 keV and below; First Results of Alumina's Structural Sensitivity to a Low-Energy Electron Beam.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
1558.
Sunaoshi, Takeshi
Okada, Satoshi
Kaji, Kazutoshi
Voelkl, Edgar
Ramachandran, Roshini
and
Salguero, Tina
2017.
Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
1830.
Brodusch, Nicolas
Demers, Hendrix
and
Gauvin, Raynald
2018.
Field Emission Scanning Electron Microscopy.
p.
1.
Machado Trindade, Bruno
Ukwatta, Eranga
Spence, Mike
and
Pawlowicz, Chris
2018.
Segmentation of Integrated Circuit Layouts from Scan Electron Microscopy Images.
p.
1.
Liddle, J. A.
Hoskins, B. D.
Vladár, A. E.
and
Villarrubia, J. S.
2018.
Research Update: Electron beam-based metrology after CMOS.
APL Materials,
Vol. 6,
Issue. 7,
Demers, Hendrix
Brodusch, Nicolas
Gauvin, Raynald
Trudeau, Michel L.
and
Zaghib, Karim
2018.
The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope.
Microscopy and Microanalysis,
Vol. 24,
Issue. S1,
p.
640.
Orji, N. G.
Badaroglu, M.
Barnes, B. M.
Beitia, C.
Bunday, B. D.
Celano, U.
Kline, R. J.
Neisser, M.
Obeng, Y.
and
Vladar, A. E.
2018.
Metrology for the next generation of semiconductor devices.
Nature Electronics,
Vol. 1,
Issue. 10,
p.
532.
Brodusch, Nicolas
Demers, Hendrix
Gellé, Alexandra
Moores, Audrey
and
Gauvin, Raynald
2019.
Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission mode.
Ultramicroscopy,
Vol. 203,
Issue. ,
p.
21.
Caplins, Benjamin W.
Holm, Jason D.
and
Keller, Robert R.
2019.
Transmission imaging with a programmable detector in a scanning electron microscope.
Ultramicroscopy,
Vol. 196,
Issue. ,
p.
40.
Formo, Eric V.
Howe, Jane Y.
Sunaoshi, Takeshi
Muto, Atsushi
Kilcrease, Jim
and
Salguero, Tina
2019.
Application of Low kV EELS to Problematic Samples.
Microscopy and Microanalysis,
Vol. 25,
Issue. S2,
p.
466.
Caplins, Benjamin W.
Holm, Jason D.
White, Ryan M.
and
Keller, Robert R.
2020.
Orientation mapping of graphene using 4D STEM-in-SEM.
Ultramicroscopy,
Vol. 219,
Issue. ,
p.
113137.
Brodusch, Nicolas
and
Gauvin, Raynald
2020.
Is a 30 kV CFE-SEM in STEM-in-SEM Mode Suitable for Characterizing Real Materials?.
Microscopy and Microanalysis,
Vol. 26,
Issue. S2,
p.
1218.
Graham, Uschi M.
Dozier, Alan K.
Oberdörster, Günter
Yokel, Robert A.
Molina, Ramon
Brain, Joseph D.
Pinto, Jayant M.
Weuve, Jennifer
and
Bennett, David A.
2020.
Tissue Specific Fate of Nanomaterials by Advanced Analytical Imaging Techniques - A Review.
Chemical Research in Toxicology,
Vol. 33,
Issue. 5,
p.
1145.
Konvalina, Ivo
Daniel, Benjamin
Zouhar, Martin
Paták, Aleš
Müllerová, Ilona
Frank, Luděk
Piňos, Jakub
Průcha, Lukáš
Radlička, Tomáš
Werner, Wolfgang S. M.
and
Mikmeková, Eliška Materna
2021.
Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer.
Nanomaterials,
Vol. 11,
Issue. 9,
p.
2435.
Shiloh, R.
Chlouba, T.
and
Hommelhoff, P.
2022.
Quantum-Coherent Light-Electron Interaction in a Scanning Electron Microscope.
Physical Review Letters,
Vol. 128,
Issue. 23,
Davies, Thomas E.
Li, He
Bessette, Stéphanie
Gauvin, Raynald
Patience, Gregory S.
and
Dummer, Nicholas F.
2022.
Experimental methods in chemical engineering: Scanning electron microscopy andX‐ray ultra‐microscopy—SEMandXuM.
The Canadian Journal of Chemical Engineering,
Vol. 100,
Issue. 11,
p.
3145.
Ramachandran, Rajasree
and
Biswas, Debabrata
2023.
A unified thermal-field emission theory for metallic nanotips.
Journal of Applied Physics,
Vol. 134,
Issue. 21,