Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 4
Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques
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- Published online by Cambridge University Press:
- 14 October 2014, pp. 1654-1661
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- Cited by 4
A Parallel Radial Mirror Energy Analyzer Attachment for the Scanning Electron Microscope
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- Published online by Cambridge University Press:
- 28 September 2015, pp. 142-147
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- Cited by 4
Nanobead Formation and Nanopatterning in Glasses
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 434-435
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- Cited by 4
Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 1212-1213
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- Cited by 4
Remote Plasma Cleaning and Radical Recombination Rates
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- 25 July 2016, pp. 46-47
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- Cited by 4
High Performance Polymers in Additive Manufacturing Processes: Understanding Process, Structure and Property
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- 23 September 2015, pp. 127-128
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Improved sample preparation of beam-sensitive ultra-thin cuprate films
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- 05 August 2019, pp. 686-687
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- Cited by 4
The Munich Compact Light Source: Biomedical Research At a Laboratory-Scale Inverse-Compton Synchrotron X-ray Source
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- 01 August 2018, pp. 984-985
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- Cited by 4
First Nucleotide Sequence Data from an Electron Microscopy Based DNA Sequencer
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 208-209
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Capability and Uncertainty of Standardless Procedures for Quantitative Electron Probe X-ray Microanalysis
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- Published online by Cambridge University Press:
- 21 July 2003, pp. 524-525
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- Cited by 4
Focused Ion Beam (FIB) Microscopy and Technology
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 558-559
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- Cited by 4
High Resolution TEM Imaging with Hollow-Cone Illumination
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- 02 July 2020, pp. 1191-1192
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- Cited by 4
Measuring Chemical Segregation at Grain Boundaries by Atom Probe Tomography
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- 09 October 2013, pp. 940-941
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Performance of Low-kV Aberration-corrected STEM with Delta-corrector and CFEG in Ultrahigh Vacuum Environment
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 468-469
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Towards Quantitative EDX Results in 3 Dimensions
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- 27 August 2014, pp. 766-767
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Using EDX/SEM to Study Heavy Metal Uptake and Elemental Composition in Plant Tissues
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- 18 July 2003, pp. 1486-1487
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Gun Shot Residue Analysis and Distinguishing the Formation of GSR from Environmental Particles
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 64-65
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The Effects of Electron Beam Melting on the Microstructure and Mechanical Properties of Ti-6Al-4V and Gamma-TiAl
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- 23 September 2015, pp. 1177-1178
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In Situ Observation of the Evolution of Pt Particles in a Perovskite-Based Catalyst During Redox Cycling at High Temperature and Atmospheric Pressure with Atomic Resolution
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- 23 November 2012, pp. 1120-1121
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The Calamistrum of the Feather-Legged Spider Uloborus plumipes Investigated by Focused Ion Beam and Scanning Electron Microscopy (FIB–SEM) Tomography
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- Published online by Cambridge University Press:
- 21 March 2018, pp. 139-146
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