Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 4
Maskless Fabrication of Highly-Ordered Periodic Nanopillars using FIB and Bitmap Control
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 822-823
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- Cited by 4
3-D X-ray Microscopy using a Laboratory Source
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- Published online by Cambridge University Press:
- 01 August 2004, pp. 1036-1037
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- Cited by 4
Application of Scanning Electron Microscopy/Energy-Dispersive X-Ray Spectroscopy for Characterization of Detrital Minerals in Karst Cave Speleothems
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- Published online by Cambridge University Press:
- 25 February 2016, pp. 87-98
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- Cited by 4
Microscopic analysis of lead accumulation in tobacco (Nicotiana tabacum var. turkish) roots
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 1528-1529
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- Cited by 4
Cryo-EM of Li Metal Battery Aging and Failure Mechanisms
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- Published online by Cambridge University Press:
- 30 July 2020, pp. 1652-1653
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- Cited by 4
Determining Grain Boundary Position and Geometry from EBSD Data: Limits of Accuracy
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- Published online by Cambridge University Press:
- 15 November 2021, pp. 96-108
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- Cited by 4
Electron and Force Microscopy Characterization of Particle Size Effects and Surface Phenomena Associated with Individual Natural Organic Matter Fractions
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- Published online by Cambridge University Press:
- 26 February 2014, pp. 521-530
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- Cited by 4
Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications. David Attwood. 1999. Cambridge University Press, Cambridge, UK. 470 pages. (hardback, $59.95)
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- Published online by Cambridge University Press:
- 01 November 2001, p. 536
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- Cited by 4
Analysis of Experimental Error in High Resolution Electron Micrographs
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- Published online by Cambridge University Press:
- 31 January 2003, pp. 451-457
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- Cited by 4
Way to Reduce Electron Dose in Pseudo Atomic Column Elemental Maps by 2D STEM Moire Method
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 1790-1791
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- Cited by 4
X-ray Emission From Thin Films on a Substrate - Experiments and Simulation
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- 25 July 2016, pp. 400-401
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- Cited by 4
Towards Reliable Quantification of Steel Alloys at Low Voltage
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 700-701
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- Cited by 4
The Staining of Polymers
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- 01 August 2002, pp. 190-191
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- Cited by 4
In-situ Mechanical Testing of Micro-Sized Specimens Fabricated by FIB
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 100-101
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- Cited by 4
Comparing the Intensities and Spectral Resolution Achieved by Wavelength-Dispersive Spectrometers on Electron Microprobes and SEMs
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- 23 September 2015, pp. 1877-1878
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- Cited by 4
Precipitation and its Development in Maraging Steels Investigated by AP and EFTEM What is the Role of Mo?
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- Published online by Cambridge University Press:
- 05 August 2007, pp. 1626-1627
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- Cited by 4
Atomic Scale Chemical Mapping in SrO(SrTiO3)6 Ruddlesden-Popper Thin Film
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1396-1397
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- Cited by 4
Electron Microscopy of Morphed Graphene Nanostructures Synthesized by Mechanical Milling
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- 25 July 2016, pp. 1250-1251
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Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices
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- 01 August 2018, pp. 500-501
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- Cited by 4
Taking Advantage of Scattering Delocalization To Reduce Radiation Damage In Vibrational or Valence-Loss EELS and Energy-Filtered TEM Images
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 960-961
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