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Taking Advantage of Scattering Delocalization To Reduce Radiation Damage In Vibrational or Valence-Loss EELS and Energy-Filtered TEM Images

Published online by Cambridge University Press:  25 July 2016

R.F. Egerton ,
T. Aoki  and
P.A. Crozier
R.F. Egerton
Affiliation:
Department of Physics, University of Alberta, Edmonton, Canada
T. Aoki
Affiliation:
LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe, USA
P.A. Crozier
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 960 - 961
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Egerton, RF EELS in the Electron Microscope, 3rd Edition , (Springer (2011). p. 223.Google Scholar
[2] Rez, P, et al., submitted to Nature Communications (2016).Google Scholar
[3] Egerton, RF Ultramicroscopy 159 (2015). p. 95.Google Scholar
[4] The authors acknowledge funding the Natural Sciences and Engineering Research Council of Canada (NSERC) and the US Department of Energy (DE-SC0004954).Google Scholar