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Analysis of Experimental Error in High Resolution Electron Micrographs

Published online by Cambridge University Press:  31 January 2003

Geoffrey H. Campbell ,
Wayne E. King  and
Dov Cohen
Geoffrey H. Campbell
Affiliation:
Lawrence Livermore National Laboratory, Chemistry and Materials Science Directorate, Livermore, CA 94550
Wayne E. King
Affiliation:
Lawrence Livermore National Laboratory, Chemistry and Materials Science Directorate, Livermore, CA 94550
Dov Cohen
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
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Abstract

Analysis of Experimental Error in High Resolution Electron Micrographs

Type
Research Article
Information
Microscopy and Microanalysis , Volume 3 , Issue 5 , September 1997 , pp. 451 - 457
Copyright
2001 Cambridge University Press

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