Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 4
Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell, 2nd Edition. Edited by Joachim Frank. Springer, Albany, NY; 2006, 455 pages. ISBN 0-387-31234-X (HB)
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- Published online by Cambridge University Press:
- 04 July 2008, pp. 370-371
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- Cited by 4
A Novel Technique for Probe Intensity Profile Characterisation in the Environmental Scanning Electron Microscope
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 294-295
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- Cited by 4
Using Ma ss Resolving Power as a Performance Metric in the Atom Probe
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 680-681
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- Cited by 4
Environmental Liquid Cell Technique for Improved Electron Microscopic Imaging of Soft Matter in Solution
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- 07 December 2020, pp. 44-53
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Accuracy of Local Polarization Measurements by Scanning Transmission Electron Microscopy
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- 21 October 2022, pp. 2047-2058
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Direct-Writing of Cu Nano-Patterns with an Electron Beam
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- 18 September 2015, pp. 1639-1643
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Towards Reliable Quantification of Steel Alloys at Low Voltage
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- 27 August 2014, pp. 700-701
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Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications. David Attwood. 1999. Cambridge University Press, Cambridge, UK. 470 pages. (hardback, $59.95)
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- 01 November 2001, p. 536
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Analysis of Experimental Error in High Resolution Electron Micrographs
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- 31 January 2003, pp. 451-457
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New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging
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- 08 April 2017, pp. 756-757
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X-ray Emission From Thin Films on a Substrate - Experiments and Simulation
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- 25 July 2016, pp. 400-401
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Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond
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- 26 July 2009, pp. 328-329
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A Study of Glass Composition and Crizzling in Two Claude Laurent Glass Flutes from the Library of Congress
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- 23 September 2015, pp. 1161-1162
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News on Silicon Drift Detectors for X-Ray Nanoanalysis in S/TEM
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- 01 August 2010, pp. 2-3
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Aberration Corrected Wien Filter as a Monochromator of High Spatial and High Energy Resolution Electron Microscopes
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- 16 July 2003, pp. 944-945
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Wear of Si Cantilever Tips used in Atomic Force Acoustic Microscopy
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- 01 August 2005, pp. 364-365
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Zeolite Crystal Growth Analysis by Dissolution
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- 05 August 2019, pp. 816-817
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Unveiling the Early Stages of the F-element Oxalate Growth Evolution with Cryo-TEM
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- 30 July 2020, pp. 642-644
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Disordered Spheres with Extensive Overlap in Projection: Image Simulation and Analysis
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- 07 November 2011, pp. 872-878
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Simultaneous Hard X-ray Ptychographic Tomography and X-ray Fluorescence Tomography of Isolated Hollow Core-Shell GaN Rods
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- 10 August 2018, pp. 32-33
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