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Aberration Corrected Wien Filter as a Monochromator of High Spatial and High Energy Resolution Electron Microscopes

Published online by Cambridge University Press:  16 July 2003

K. Tsuno ,
D. Ioanoviciu  and
G. Martinez
K. Tsuno
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo 196-0001, Japan
D. Ioanoviciu
Affiliation:
Institute of Isotopic and Molecular Technology, P.O. Box 700, R-3400, Cluj-Napoca, Rumania
G. Martinez
Affiliation:
Dept. Fisica Aplicada III, Facide Fisica, Univ. Complutense, E-28040, Madrid, Spain

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 944 - 945
Copyright
Copyright © Microscopy Society of America 2003