The electron backscatter coefficient (η) and the related
correction factor for X-ray intensity (R) are both strongly
dependent on atomic number and although quite good data are available
for pure elements, the derivation of values for compounds is
problematic. This issue is addressed by Donovan, Pingitore, and
Westphal (Microscopy and Microanalysis, Vol. 9, No. 3, June
2003, pp. 202–215), in which an “electron fraction”
averaging method is advocated as an improvement on
“traditional” mass fraction averaging, which is known to be
only an approximation. (The difference, according to Table 3, is only
significant, however, for samples containing heavy elements such as Pb
and Th.) New thinking on this topic is welcome, but I believe this
proposal should be treated with caution pending more rigorous
testing.