Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 9 - August 2003

Invited Papers

Numerical Nanodiffraction of Amorphous Grain Boundary Films

Is there a Stobbs-Factor in Off-axis Electron Holography?

Other

Microscopy Society Of America

Invited Papers

Atomic Structure Imaging Using an Aberration-Corrected Transmission Electron Microscope

Abstract

Nanostructured Materials as Studied with the Tomographic Atom Probe (TAP)

Invited Papers

Enhanced imaging of thin intergranular films in HRTEM using Fourier filtering

Abstract

Thermal Stability of Co-Fe and Cu Multilayered Thin Films

Understanding Phase Stability in Multilayers by Atom Probe Analysis

Invited Papers

Quantitative HAADF-STEM image analysis using IMAGE-WARP processing

Other

Microbeam Analysis Society

Invited Papers

HREM Study of Hexagonal and Rhombohedral Graphites for use as Anodes in Lithium Ion Batteries

Abstract

TEM Observations on the Role of Defects in Melting, Migration and Transformation of Pb-rich Precipitates in Al

Invited Papers

Stability of parameter retrieval using inverse electron scattering

New Tools for Imaging, Spectroscopy and Diffraction from Nanostructures

Abstract

AEM / HRTEM Studies of Interface Diffusion-Controlled Transformations

Tin in Early Chinese Ceramics

Invited Papers

Image analysis and simulation software in transmission electron microscopy

Quantitative Evaluation of Focal Series in HRTEM

Other

The InterAmerican Committee of Societies for Electron Microscopy

Invited Papers

Electron Interference Fringes observed in Fourier Space and its Application

Microscopy and Microanalysis

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Volume 9 - August 2003

Invited Papers

Other

Invited Papers

Abstract

Invited Papers

Abstract

Invited Papers

Other

Invited Papers

Abstract

Invited Papers

Abstract

Invited Papers

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Invited Papers