Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 4
Pre-sharpened Microtips: An Efficient Sample Preparation Method for Atom Probe Tomography
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 296-297
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- Cited by 4
A Piezoelectric Goniometer Inside a Transmission Electron Microscope Goniometer
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- Published online by Cambridge University Press:
- 13 September 2011, pp. 827-833
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- Cited by 4
Progress in Microtomography at the ANATOMIX Beamline of Synchrotron Soleil
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 244-245
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- Cited by 4
Behavior of Au Species in Au/FeOx Catalysts as a Result of In-Situ Thermal Treatments, Characterized via Aberration-Corrected STEM Imaging
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1482-1483
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- Cited by 4
Transmission Electron Microscopy; Diffraction, Imaging, and Spectrometry C. Barry Carter and David B. Williams (Eds.). Springer International Publishing, Switzerland 2016, 518 pp. ISBN: 978-3-3-319-26649-7.
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- Published online by Cambridge University Press:
- 28 June 2018, p. 324
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- Cited by 4
Combining Structural and Chemical Information on the Nanometer Scale by Correlative TEM and APT
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 948-949
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The Real Structure of Cu3Ni2SbO6 and Cu3Co2SbO6 Delafossites with Honeycomb Lattices by Aberration-Corrected HRTEM
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- 27 August 2014, pp. 950-951
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Synergy of Combined (S)TEM Imaging Techniques for the Characterization of Catalyst Behavior During In-Situ Heating
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 312-313
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- Cited by 4
Tomographic Spectral Imaging with a Dual-Beam FIB/SEM: 3D Microanalysis
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- Published online by Cambridge University Press:
- 01 August 2004, pp. 1132-1133
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- Cited by 4
Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis
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- Published online by Cambridge University Press:
- 06 August 2003, pp. 120-121
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- Cited by 4
Dark-Field X-Ray Microscopy of Immunogold-Labeled Cells
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- Published online by Cambridge University Press:
- 31 July 2003, pp. 53-62
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Advantages of Broad Ion Beam (BIB) Processing Compared with Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids
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- Published online by Cambridge University Press:
- 05 September 2003, pp. 148-149
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Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging
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- Published online by Cambridge University Press:
- 30 July 2021, pp. 1008-1010
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Cryopreparation for Interfacial Atom-Probe Analysis
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- Published online by Cambridge University Press:
- 03 August 2008, pp. 122-123
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Deep Learning for Sparse Scanning Electron Microscopy
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- 05 August 2019, pp. 158-159
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Role of Electron Microscopy in Early Detection of Altered Epithelium During Experimental Oral Carcinogenesis
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- Published online by Cambridge University Press:
- 14 March 2019, pp. 1367-1375
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- Cited by 4
Quantitative Differentiation of Three Iron Oxides by EDS
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 1046-1047
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ctfExplorer: Interactive Software for 1d and 2d Calculation and Visualization Of TEM Phase Contrast Transfer Function
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 1572-1573
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Correlative In-Situ AFM & SEM & EDX Analysis of Nanostructured Materials
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- 04 August 2017, pp. 26-27
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- Cited by 4
Color Metallography and Electron Microscopy Techniques Applied to the Characterization of 413.0 Aluminum Alloys
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- Published online by Cambridge University Press:
- 24 May 2013, pp. 1019-1026
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