Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 4
Dark-Field X-Ray Microscopy of Immunogold-Labeled Cells
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- Published online by Cambridge University Press:
- 31 July 2003, pp. 53-62
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- Cited by 4
Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis
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- Published online by Cambridge University Press:
- 06 August 2003, pp. 120-121
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- Cited by 4
Advantages of Broad Ion Beam (BIB) Processing Compared with Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids
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- Published online by Cambridge University Press:
- 05 September 2003, pp. 148-149
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- Cited by 4
Windowless, Silicon Nitride window and Polymer window EDS detectors: Changes in Sensitivity and Detectable Limits
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 1645-1646
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- Cited by 4
Methylene Blue Loaded PLGA Nanoparticles: Combined Emulsion, Drug Release Analysis and Photodynamic Activity
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 1212-1213
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Measuring Sperm Movement within the Female Reproductive Tract using Fourier Analysis
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- Published online by Cambridge University Press:
- 02 February 2015, pp. 256-263
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FIB Prepared TEM Sample Lift-out Using MEMS Grippers
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- Published online by Cambridge University Press:
- 01 August 2004, pp. 1144-1145
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Electrons, Ions and Cathodoluminescence in the Environmental SEM
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- 02 July 2020, pp. 290-291
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Are Dislocations Present in Nanoparticles?: Fourier Filtering of Images Obtained From In-Situ TEM Nanoindentation
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 736-737
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Standardization on Particle Size Distribution Measurement of Nanomaterials
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- 23 September 2015, pp. 2399-2400
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Mapping The Valence States of Transition Metals Across Interfaces By Energy-Filtered Tem
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- 02 July 2020, pp. 102-103
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Alumina-supported Tri-rhenium Clusters Revealed by Aberration-corrected Electron Microscopy
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- 01 August 2005, pp. 1574-1575
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- Cited by 4
Plasma FIB Spin Milling for Large Volume Serial Sectioning Tomography
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- 05 August 2019, pp. 350-351
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Novel Preparation of Precision Planar TEM Specimens for Integrated Circuits Using Dual-Beam Focused Ion Beam
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- 02 July 2020, pp. 904-905
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The Size and Morphological Study of Spherical Polyelectrolyte Complex Beads Using Environmental Scanning Electron Microscopy
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- 23 September 2015, pp. 1697-1698
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FIB-SEM Nanotomography in Materials and Life Science at EPFL
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- 01 August 2010, pp. 226-227
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FIB Preparation of Mesa Structures for SIMS Analysis
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- 01 August 2002, pp. 542-543
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- Cited by 4
Kink Band Formation in High-strength Bulk Metallic Nanolaminates
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- 23 September 2015, pp. 1157-1158
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Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques
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- 14 October 2014, pp. 1654-1661
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Probing the deactivation of NiGa nanoparticles as catalyst for methanol synthesis with environmental TEM
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- 23 November 2012, pp. 1380-1381
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