Are Dislocations Present in Nanoparticles?: Fourier Filtering of Images Obtained From In-Situ TEM Nanoindentation

C Carlton; PJ Ferreira

doi:10.1017/S1431927609096585

Are Dislocations Present in Nanoparticles?: Fourier Filtering of Images Obtained From In-Situ TEM Nanoindentation

Published online by Cambridge University Press: 26 July 2009

C Carlton and

PJ Ferreira

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C Carlton: Affiliation:
University of Texas,Austin
PJ Ferreira: Affiliation:
University of Texas,Austin

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 736 - 737

DOI: https://doi.org/10.1017/S1431927609096585 [Opens in a new window]

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Are Dislocations Present in Nanoparticles?: Fourier Filtering of Images Obtained From In-Situ TEM Nanoindentation

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