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Pre-sharpened Microtips: An Efficient Sample Preparation Method for Atom Probe Tomography

Published online by Cambridge University Press:  26 July 2009

R Shivaraman
Affiliation:
Imago Scientific Instruments Corp
R Ulfig
Affiliation:
Imago Scientific Instruments Corp
DJ Larson
Affiliation:
Imago Scientific Instruments Corp
H Fukuzawa
Affiliation:
Toshiba Corporation
DC Bell
Affiliation:
Harvard University
H Wang
Affiliation:
Harvard University
R Gordon
Affiliation:
Harvard University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009