Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The Joy of Scanning Electron Microscopy

Abstract

My Joy of Research in SEM

Visualizing Astigmatism in the SEM Electron Probe

Detection Systems of Ultra-High-Resolution SEMs

'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?"

EBSD: Now Spanning Centimeters to Nanometers!

Complementarity of On-Axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM

Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr

Non-local Denoising of EBSD Patterns for Enhanced Indexing

Applying SEM, EPMA and EBSD Analytic Techniques on Solder Joint for Microelectronic Package Development

The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias

Energy-Momentum Spectroscopy by Highly Parallelized Wavelength- and Angularly-Resolved Cathodoluminescence in the Scanning Electron Microscope

Joy of Scanning with Electron and X-ray Imaging

DELTA - A Novel Ultra-Low Voltage SEM for Electron Spectroscopic Imaging

Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends

A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids

Grain Size Analysis in Lithium Aluminate Ceramics

Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns

In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System

Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope

The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The Joy of Scanning Electron Microscopy

Abstract