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'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?"

Published online by Cambridge University Press:  01 August 2018

Dale E. Newbury
Dale E. Newbury*
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 608 - 609
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Goldstein, J., et al in "Scanning Electron Microscopy and X-ray Microanalysis". Springer New York.Google Scholar
[2] Oatley, C. in "The Scanning Electron Microscope". Cambridge University Press. p 17.Google Scholar
[3] Rose, A. Adv. in Electronics 1 1948) p 131.Google Scholar
[4] Bright, D., Newbury, D. Steel, E. J. Micros 189 1998) p 25.Google Scholar