Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-25T05:50:12.368Z Has data issue: false hasContentIssue false
  • English
  • Français

Non-local Denoising of EBSD Patterns for Enhanced Indexing

Published online by Cambridge University Press:  01 August 2018

David J. Rowenhorst  and
Patrick T. Brewick
David J. Rowenhorst
Affiliation:
U.S. Naval Research Laboratory, Code 6350, Washington, DC 20375
Patrick T. Brewick
Affiliation:
U.S. Naval Research Laboratory, Code 6350, Washington, DC 20375

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 616 - 617
Copyright
© Microscopy Society of America 2018 

References

[1] Wright, S.I., etal, Ultramicroscopy vol. 159 2015) p 81.Google Scholar
[2] Chen, Y.H., et al, Microsc. Microanal vol. 21 2015) p 739.Google Scholar
[3] Buades, A., Coll, B. Morel, J. M. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2005, vol. 2, (2005) p. 60.Google Scholar
[4] This work was funded by the Naval Research Laboratory under the auspices of the Office of Naval Research and from the Structural Metallics program of ONR.Google Scholar