Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis

Abstract

Inpainting Versus Denoising for Dose Reduction in STEM

Increasing the Speed of EELS/EDS Mapping Through Dynamic/Adaptive Sampling Methodologies

Compressive Sensing Reconstruction for EDS Analysis

Focused-Probe STEM Ptychography: Reconstruction Methods, Transfer Functions and Signal-to-Noise

A Natural Basis for Unsupervised Machine Learning on Scanning Diffraction Data

Exit-Wave Reconstruction and Phase Analysis Using a Hitachi SU9000 FE-SEM

Next Steps for Compressively Sensed Video in Transmission Electron Microscopy

Gesture-Based Control of the Scanning Electron Microscope Using a Low-Cost Webcam Sensor

High-speed Fly-Scan Volumetric Imaging

Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices

Inpainting Assisted Controlled Rotation Tomography (CORT)

Deep Learning Based Atom Segmentation and Noise and Missing-Wedge Reduction for Electron Tomography

Deep Learning for Lensless Compressive Imaging

Problems and Progress in Automating Electron Microscopy Segmentation

An Autonomous Microscopy Workflow for Structure Determination from Atomic-Resolution Images

Identifying Atoms in High Resolution Transmission Electron Micrographs Using a Deep Convolutional Neural Net

Pioneering the Use of Neural Network Architectures and Feature Engineering for Real-Time Augmented Microscopy and Analysis

Real-time Image Processing and Restoration Prototype for the SEM: Initial Steps

Tricky Registration for Unruly Data: Image Registration of Low-Signal-to-Noise Cryo-STEM Data

Machine Learning Powered Image Segmentation

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis

Abstract