Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

New Advances in Electron Energy Loss Spectroscopy and Allied Techniques

Abstract

DualEELS at High Energy Losses: Exploring Lower Accelerating Voltages and Absolute Cross Sections

Electron Energy Loss Spectroscopy of Actinides at the Nanogram Scale

Advances in Ultra-High Energy Resolution STEM-EELS

Atomically Resolved EELS Elemental and Fine Structure Mapping via Multi-Frame and Energy-Offset Correction Acquisition

Direct Detection Carbon Electron Energy Loss Spectroscopy on Zeolites

Direct Detection Electron Energy-loss Spectroscopy: Applications in Low-dose Chemical Mapping and In Situ Heating+biasing

Direct Electron Detection for Atomic-Resolution EELS Mapping at Cryogenic Temperature

Characterization of Sub-Bandgap Energy States in CuInxGa(i-x)Se2 and Transparent Conducting Oxides with Electron Energy-Loss Spectroscopy

Characterization of Mixed Metal Oxide Interfaces Based on TiO2-supported CeO2-x Nanoparticles

Aloof-beam Vibrational Electron Energy-loss Spectroscopy of Adsorbate/Metal Particle Systems

Investigation of Surface and Bulk Vibrational Modes in SiC Polytypes using Spatially Resolved Monochromated HREELS

EELS Analysis of Bulk Plasmon Harmonics of Aluminium at 30 keV

Momentum Resolved EELS of Plasmons at Al Grain Boundaries without a q-Slit Aperture

EELS of the Interface between Al and Glass Formed with a High Speed Collision Process of Cold Spray

Electron Microscopy and Electron Energy-Loss Spectroscopy (EELS) of Few-Layer Chemically-Exfoliated Phosphorene Flakes

Quantification of Composition of Epitaxial Si/SiGe by EELS

Advantages of Direct Detection and Electron Counting for High-Energy Resolution and Monochromated Electron Energy Loss Spectroscopy Data Acquisition

Molecular Excitation Spectroscopy near Metallic Surfaces using Electron Energy Loss Spectroscopy

Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis

Abstract

The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing

Fact or Fiction: Maximal Image Quality with Minimal Dwell Time

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

New Advances in Electron Energy Loss Spectroscopy and Allied Techniques

Abstract

Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis

Abstract