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Direct Electron Detection for Atomic-Resolution EELS Mapping at Cryogenic Temperature

Published online by Cambridge University Press:  01 August 2018

David J. Baek ,
Michael J. Zachman ,
Berit H. Goodge ,
Di Lu ,
Yasuyuki Hikita ,
Harold Y. Hwang  and
Lena F. Kourkoutis
David J. Baek
Affiliation:
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA.
Michael J. Zachman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Berit H. Goodge
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Di Lu
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA, USA.
Yasuyuki Hikita
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo, Park, CA, USA.
Harold Y. Hwang
Affiliation:
Department of Applied Physics, Stanford University, Stanford, CA, USA. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo, Park, CA, USA.
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA. Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 454 - 455
Copyright
© Microscopy Society of America 2018 

References

[1] Muller, D. A., et al, Science 319 2008) p. 1073.Google Scholar
[2] Klie, R. F., et al, Phys. Rev. Lett. 99 2007) p. 047203.Google Scholar
[3] Zhao, W., et al. (2017) arXiv 1701, 03678.Google Scholar
[4] Hart, J. L., et al, Scientific Reports 7 2017) p. 8243.Google Scholar
[5] This work was supported by the Department of Defense Air Force Office of Scientific Research (FA 9550-16-1-0305) and National Science Foundation (DMR-1539918, DMR-1429155, DMR-1719875).Google Scholar