Analytical and Instrumentation Science Symposia
A02 TEM Phase Contrast Imaging
Abstract
High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors
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- 23 September 2015, pp. 2303-2304
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Electron-Beam Shaping
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- 23 September 2015, pp. 2305-2306
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A03 Electron Holography for Nanofields in Solids
Abstract
A Phase Space Perspective on Electron Holography - Building Bridges Between Inline-, Off-axis Holography, Differential Phase Contrast and Diffractive Imaging
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- 23 September 2015, pp. 2307-2308
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Lorentz-STEM imaging of Fields and Domains using a High-Speed, High-Dynamic Range Pixel Array Detector at Atomic Resolution
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- 23 September 2015, pp. 2309-2310
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Hybrid Electron Holography
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- 23 September 2015, pp. 2311-2312
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Interface Magnetism Studied by Electron Holography with Multiple-biprisms
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- 23 September 2015, pp. 2313-2314
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A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences
Abstract
A Cryo-FIB Lift-Out Procedure for Cryo-TEM Sample Preparation at Soft-Hard Matter Interfaces
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- 23 September 2015, pp. 2315-2316
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Temporospatial Relationship of Lipid Droplets and Mitochondria in Cardiac Muscle by Focused Ion Beam Scanning Electron Microscopy
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- 23 September 2015, pp. 2317-2318
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SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics
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- 23 September 2015, pp. 2319-2320
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Application of Focused Helium Ion Beams for Direct-write Lithography of Superconducting Electronics
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- 23 September 2015, pp. 2321-2322
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A05 Fast and Ultrafast Imaging with Electrons and Photons
Abstract
Materials Processes Observed using Dynamical Environmental TEM at University of Illinois
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- 23 September 2015, pp. 2323-2324
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Strain Mapping during In-situ Deformation using a High-Speed Electron Detector
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- 23 September 2015, pp. 2325-2326
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Fast Imaging of Carbon Nanotube Carpet Growth by Environmental TEM
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- 23 September 2015, pp. 2327-2328
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Compression Algorithm Analysis of In-Situ (S)TEM Video: Towards Automatic Event Detection and Characterization
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- 23 September 2015, pp. 2329-2330
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A06 Advanced Analytical TEM/STEM
Abstract
New Discrete Tomographic Reconstruction Method for Electron Tomography
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- 23 September 2015, pp. 2331-2332
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Challenges and Opportunities in 3D Tri-gate Transistor Characterization
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- 23 September 2015, pp. 2333-2334
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Robust Physical Alignment Models for Electron Tomography
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- 23 September 2015, pp. 2335-2336
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Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy
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- 23 September 2015, pp. 2337-2338
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HAADF-STEM and Super-X™ XEDS Tomography of Complex Nano-scale Precipitates in a High Entropy Alloy, AlMo0.5NbTa0.5TiZr
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- 23 September 2015, pp. 2339-2340
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Linear chemically sensitive electron tomography using DualEELS and compressed sensing
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- 23 September 2015, pp. 2341-2342
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