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Strain Mapping during In-situ Deformation using a High-Speed Electron Detector

Published online by Cambridge University Press:  23 September 2015

C. Gammer
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 USA Department of Materials Science & Engineering, University of California, Berkeley, CA 94720 USA Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Austria
J. Kacher
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 USA Department of Materials Science & Engineering, University of California, Berkeley, CA 94720 USA
J. Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 USA
C. Czarnik
Affiliation:
Gatan, Inc., Pleasanton, CA 94588 USA
O.L. Warren
Affiliation:
Hysitron, Inc., Minneapolis, MN 55344 USA
A.M. Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 USA Department of Materials Science & Engineering, University of California, Berkeley, CA 94720 USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Yu, Q., Legros, M. & Minor, A.M., MRS Bulletin 40 (2015). p. 62.Google Scholar
[2] Hytch, M. J., Snoeck, E. & Kilaas, R., Ultramicroscopy 74 (1998). p. 131.Google Scholar
[3] Ozdol, V.B., Gammer, C., Sarahan, M.C. & Minor, A.M., Microscopy and Microanalysis 20(S3 (2014). p. 1046.Google Scholar
[4] Gammer, C., Ozdol, V.B., Liebscher, C.H. & Minor, A.M. submitted to Ultramicroscopy..Google Scholar
[5] The authors acknowledge support by the Austrian Science Fund (FWF):[J3397] and the Molecular Foundry, Lawrence Berkeley National Laboratory, which is supported by the U.S. Dept. of Energy under Contract # DE-AC02-05CH11231..Google Scholar