Skip to main content Accessibility help
×
Home
Hostname: page-component-747cfc64b6-dkhcg Total loading time: 0.265 Render date: 2021-06-16T07:56:55.887Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true }

High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors

Published online by Cambridge University Press:  23 September 2015

Hao Yang
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK
Lewys Jones
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK
Henning Ryll
Affiliation:
.PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Martin Simson
Affiliation:
.PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
Heike Soltau
Affiliation:
.PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
Yukihito Kondo
Affiliation:
.JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Ryusuke Sagawa
Affiliation:
.JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Hiroyuki Banba
Affiliation:
.JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Timothy J Pennycook
Affiliation:
.Faculty of Physics, University of Vienna, Vienna, Austria
Peter D. Nellist
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this article. For PDF version, please use the ‘Save PDF’ preceeding this image.
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Henderson, R. Quarterly Reviews of Biophysics 28, 171193 (1995).CrossRefGoogle Scholar
[2] Rodenburg, J. M., et al., Ultramicroscopy 48, 304314 (1993).CrossRefGoogle Scholar
[3] Pennycook, T. J., et al. Ultramicroscopy. doi:10.1016/j.ultramic.2014.09.013.Google Scholar
[4] Yang, H., et al. Ultramicroscopy. doi:10.1016/j.ultramic.2014.10.013.Google Scholar
[5] The authors acknowledge funding from the EPSRC (grant numbers EP/K032518/1 and EP/K040375/1) and the EU Seventh Framework Programme: ESTEEM2..Google Scholar
You have Access
3
Cited by

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *