Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Electron impact investigation of hybridization schemes in coupled split-ring resonators

Visualizing Plasmonic Coupling in Metamaterials and Applying Angular Resolved EELS

Edge modes of surface plasmon nanodisk antennas visualized in 3-photon PEEM

Direct Observation of Plasmonic Enhancement of Emission in Ag-nanoparticle-decorated ZnO nanostructures

A15 Imaging Mass Spectrometry

Abstract

Nanoscale Imaging Mass Spectrometry using Cluster Ion Beams

Multimodal Imaging of Environmental and Biological Liquid Surfaces and Interfaces Using Imaging Mass Spectrometry

Molecular Characterization of Lubricant Degradation Produced in a Tribological Wear Test Using TOF-SIMS Imaging MS

High-Resolution Imaging of the Distributions of Cholesterol, Sphingolipids, and Specific Proteins in the Plasma Membrane with Secondary Ion Mass Spectrometry

A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis

Abstract

Standardization on Particle Size Distribution Measurement of Nanomaterials

Shape Recognition of Nanoparticles by High-Resolution SEM and TSEM

Assessment of Different Electron Microscopy Techniques for Particle Size Quantification of Potential Nanomaterials

Three Dimensional Accurate Morphology Measurements of Polystyrene Standard Particles on Silicon Substrate by Electron Tomography

Repeatable and Transferable Processing for Electron Tomography: An Open Platform for Visualization and Reconstruction of 3D Materials

Physical Science Symposia

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

Revealing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data

Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors

Increased Fluctuation of Interatomic Distances in Distorted Structure of Stoichiometric LaMnO3

Maximising Information from Aberration-Corrected STEM images: Applications to Plasmonic, Semiconductor and Battery Materials

Direct Observation of Interfacial Au atoms Using STEM Depth Sectioning

P07 Metallography and Microstructural Characterization of Metals

Abstract

3D Multiscale Characterization of Discontinuities in Underwater Wet Welds

EBSD Texture Analysis as a Measure of Local Flow in Friction Stir Welding

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

A15 Imaging Mass Spectrometry

Abstract

A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis

Abstract

Physical Science Symposia

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

P07 Metallography and Microstructural Characterization of Metals

Abstract