Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Local Variations in the Surface Plasmon at Al Grain Boundaries and its Effect on the Optical Properties of Al Nanostructures

Three-dimensional Surface Charge Reconstructions of Surface Plasmon Modes of Silver Right Bipyramids

High Resolution Characterization of Plasmonic Hybridization in Silver Nanostructures

A15 Imaging Mass Spectrometry

Abstract

MALDI Imaging MS: Molecular Visualization of Tissues in Drug Discovery and Development

Development of Laser Ionization Imaging Mass Spectrometry for Multiple Drugs Administered to Cancer Cells

Mass Spectrometry Imaging of Microbial Interactions using Matrix-Enhanced Laser Desorption/Ionization Fourier-Transform Ion Cyclotron Resonance Mass Spectrometry

Multimodal molecular imaging: Insight into the complexity of biological surfaces through speed, resolution and identification

A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis

Abstract

Standard Methods and Reference Materials for Performing a Complete EPMA WDS Instrument Diagnostic

Testing of the DR Method for Image Sharpness Determination

The Use of Color in Elemental Maps and Electron-Microscope Images

Tomographic measurement of buried interface roughness

Highly Accurate Real Space Nanometrology Using Revolving Scanning Transmission Electron Microscopy

Physical Science Symposia

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

Atomic Resolution Imaging and Spectroscopy of Pt-alloy Electrocatalytic Nanoparticles

Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films

Inversion of STEM EELS Data to Obtain Site Occupancy and Near Edge Structure

Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images

Aberration-corrected STEM of Four-atom Rhenium Nanowires Confined within Carbon Nanotubes

Collective Atomic Motion at a 90° <110> Tilt Grain Boundary in Gold

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

Electron Holography Unveiled Formation Process of Extraterrestrial Magnetite

Focused Ion Beam Nanotomography of Chondritic Meteorites: Closing the Mesoscale Length Gap in Paleomagnetic Studies

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

A15 Imaging Mass Spectrometry

Abstract

A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis

Abstract

Physical Science Symposia

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract