Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

Combined Major and Trace Element Characterization of Tourmaline: Using EPMA to Address Elemental Fractionation by Laser Ablation

The First Solar System Solids as Revealed Through Slice-and-View Imaging

P07 Metallography and Microstructural Characterization of Metals

Abstract

Comparing Field Emission Electron Microprobe to Traditional EPMA for Analysis of Metallurgical Specimens *

Influence of thermo-mechanical treatments on the microstructure and hardness of the Al-2024 alloy

Development of Quantitative Methods for Estimation of Aluminum Alloys Structure by Means of Image Analysis

Microscale torsion test to investigate initial yielding phenomenon of a single crystal copper

RIMAPS Studies on Structured Copper Foils

Microstructure Evolution of Discontinuous Precipitation and Coarsening of Co Rod-like Precipitates in Supersaturated Cu-Co alloys

Effect on Microstructure and Hardness of A2024 Aluminum Alloy Doped Cerium Oxide Nanoparticle

Characterization of Precipitate Phases in a NiCoAlFeCrTi High Entropy Alloy by Transmission Electron Microscopy

Direct Observation of the Strain Aging Effects Using the in-situ Heating and Straining Stage for TEM

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Controlled Radiolytic Synthesis in the Fluid Stage. Towards Understanding the Effect of the Electron Beam in Liquids

Development of Quantitative STEM for a Conventional S/TEM and Real-Time Current Calibration for Performing QSTEM with a Cold Field Emission Gun

High-Speed Analysis of Pt Based Alloys at High Spatial Resolution using EELS

Verifying the Structure and Composition of Prepared Porous Catalytic Supports

A Correlative Study of HRTEM, HAADF-STEM, and STEM-EELS Spectrum Imaging for Biphasic Electrochemically Active TiO2

Interface Sharpness in Amorphous Multilayer Heterostructures and their Effect on Quantum Confinement

Influence of Device Microstructure on The Optical Properties of Ge1-ySny (y=00.11) LEDs Produced by Next Generation Deposition Methods

Inter-Diffusion Characterization of SnOx/CuOx Grown on Cu Foil

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Zernike Phase Contrast Electron Microscopy: Observation of the Image Formation and Improvement of the Image Quality using Direct Detector

Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

P07 Metallography and Microstructural Characterization of Metals

Abstract

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract