Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Phase Analysis of Large EDS Datasets with Matlab

Investigation of Mg-Li-Ca alloys using a Wavelength Dispersive Soft X-ray Emission Spectrometer and EPMA

Use of a Fast WDS Instrument for Identification of Minor EDS Peaks

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

The Reliability of EBSD-based Microstructure Analysis

Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope

Real-Time Discrimination of Phases with Similar Kikuchi patterns but Different Chemistry through Simultaneous EBSD and EDS

Optimization of 3D EBSD in a FIB-SEM System Using a Static Sample Setup

Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of γ-TiAl with High Accuracy Band Detection

Can EBSD Patterns Be Used for Determination of Grain Boundary Inclination?

Automated Dictionary-based Indexing of Electron Channeling Patterns

Quantitative Analysis of Correlated 3D Strontium Titanate Datasets Collected by TriBeam and Diffraction Contrast Tomography

Pattern Overlap and High Resolution Electron Backscatter Diffraction

Electron and X-ray Diffraction Measurements of Elastic Stress and Plastic Strain from Ultrasonic Impact Treatment of Aluminum-Magnesium Alloys

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Pushing the Limits of Cathodoluminescence Signal Detection: Analyzing 2D Materials

SPARC: a Cathodoluminescence Platform for Nanoscale Plasmonics in a Scanning Electron Microscope

Measuring Gas Adsorption on Individual Facets of a Nanoparticle by a Surface Plasmon Nanoprobe

Evaluating Adhesion Layers for Plasmonic Nanostructures with Monochromated STEM-EELS and Surface Enhanced Raman Spectroscopy

Unconventional Surface Plasmon Excitations in Bi2Se3

A15 Imaging Mass Spectrometry

Abstract

Imaging Mass Spectrometry Using Ultra-high Mass Resolution Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer, SpiralTOF

MALDI and LDI Imaging of Forensic Samples by Using A Spiral-Trajectory Ion Optics Time-of-Flight Mass Spectrometer

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

A15 Imaging Mass Spectrometry

Abstract