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Can EBSD Patterns Be Used for Determination of Grain Boundary Inclination?

Published online by Cambridge University Press:  23 September 2015

Michael Chapman ,
Saransh Singh  and
Marc De Graef
Michael Chapman
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA
Saransh Singh
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA
Marc De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2039 - 2040
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Joy, D.C. in Monte Carlo Modeling for Electron Microscopy and Microanalysis (1995, Oxford University Press, New York) p. 25.CrossRefGoogle Scholar
[2] Callahan, P.G. & De Graef, M., Microscopy and Microanalysis 19, 1255–1265 (2013).Google Scholar
[3] Research supported by the Air Force Office of Scientific Research, MURI contract # FA9550-12-1-0458.Google Scholar