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Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope

Published online by Cambridge University Press:  23 September 2015

Nicolas Brodusch ,
Hendrix Demers  and
Raynald Gauvin
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2031 - 2032
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Williams, D.B. & Carter, C.B., Transmission electron microscopy: a textbook for materials science (2009) Springer.Google Scholar
[2] Pennycook, S., Ultramicroscopy 30 (1989). pp. 58–69.Google Scholar
[3] Krivanek, O.L., et al, Nature (464) 2010). pp. 571–574.Google Scholar
[4] Merli, P.G., et al, Microscopy and Microanalysis 9 (2003). pp. 142–143.Google Scholar
[5] Venables, J. & Harland, C., Philosophical Magazine, 27 (1973). pp. 1193–1200.CrossRefGoogle Scholar
[6] Wells, O.C., Scanning, 21 (1999). pp. 368–371.Google Scholar
[7] Brodusch, N., Demers, H. & Gauvin, R., Ultramicroscopy 148 (2015). pp. 123–131.Google Scholar
[8] Kaboli, S., et al, Journal of Applied Crystallography (2015). Submitted..Google Scholar