Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

Focused Ion Beam Micromachining Enables Novel Optics for X-ray Microscopy

In Situ Probing Biological Structures by Combining Focused Ion Beam and Atomic Force Microscopy

Multilayer Fresnel Zone Plates for X-ray Microscopy

FIB-assisted TEM Sample Preparation Refinement Using TRIM Simulations

Utilization of FIB Technique in TEM Specimen Preparation of GaN-based Devices for Dislocation Investigation

Nano and Microscale Patterning on Soft Matters with Ion Beam Irradiation

Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns

Superconducting Nano Wire Circuits Fabricated using a Focused Helium Beam

Manipulations of Submicro-fibers of Culex Pipiens with the Help of Nano-tweezers with Shape Memory Effect into Vacuum Chamber of FIB

Advantages of using Plasma FIB Over a Gallium LMIS Source

Large volume 3D characterization by plasma FIB DualBeam microscopy

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Bulge Testing for Strength Metrics of Detector X-Ray Windows

Elemental and Phase Analysis of the Stomatopod Dactyl Club by X-Ray Mapping

EPMA Analysis of Corroded Hot-Dip Galvanized Carbon Steel using the “Phase Map Maker” Software

Utilizing Intensity Ratios To Characterize Glass Fragments Via Micro-X-ray Fluorescence

EDX Analysis of Low Concentration Dopant using HD-2700 Aberration Corrected STEM Equipped with Dual SDD

Quantitative ED(X)S: The Zeta-Factor Method

Standardless Quantification Of Actinides By EPMA

Focused Interest Group on Microanalytical Standards (FIGMAS): Assessing the Quality, Availability and Need for Standards in the Microanalytical Community

Improved Background Correction for the Quantification of Actinide M-lines in EPMA

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract