Microscopy and Microanalysis: Volume 21 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Bandgaps and Surface Inter-Band States in Photocatalysts with High Energy Resolution EELS

Observation of Inter-Bandgap States in Doped Ceria via Monochromated EELS

Introduction to Plasmon Energy Expansion Thermometry

Nanoscopic imaging of energy transfer from single plasmonic particles to semiconductor substrates via STEM/EELS

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

Time-Resolved Imaging of Electrochemical Switching in Nanoscale Resistive Memory Elements

Dynamic Rate Mechanism of V2O5 Coated SnO2Nanowires for Lithium Ion Batteries Studied by in situ TEM

Elastic Properties of GaN Nanowires: Revealing the influence of planar defects on Young's modulus at nanoscale

Quantification of Electrochemical Nanoscale Processes in Lithium Batteries by Operando ec-(S)TEM

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

Resolving the Atomic Structure of Materials Containing Light Elements by Annular-Bright-Field Electron Microscopy

Large-Collection-Angle BF STEM Imaging of Compound Semiconductors

Atomic Scale Structure and Bonding Configurations in Monocrystalline Ah-xBxPSb Alloys Grown Lattice Matched on Si(001) Platforms

Local Chemical and Deformation Profiles in InAs/AlSb Multilayer Structures for Quantum Cascade Lasers

STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

A Multiple-Technique Approach for Resolving the Surface Structure of Lithium and Manganese Rich Transition Metal Oxides

Structure of Ru/Pt Nanocomposite Films Fabricated by Plasma-Enhanced Atomic Layer Depositions

Microstructural and Chemical Analysis of HgCdTe/CdTe/ZnTe/Si (211) for Infrared Detectors

Beam Effects During In Situ Potential Cycling and Imaging of Sulfuric Acid and Platinum Electrodes

A study in the formation of Li7La3Zr2Oi2 as a Garnet-Type Ionic Conductor Synthesized by Flame Combustion

Technologist Forum, Tutorials and Outreach Symposia

X40 Physical Sciences Tutorial: ABF STEM – Direct and Robust Atomic-resolution Imaging of Light Elements in Crystalline MaterialsTutorial

Abstract

Annular Bright Field Scanning Transmission Electron Microscopy - Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Another Phase Plate in the Zoo: Reducing Charging and Optimizing the Design of Electrostatic Phase Plates

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Technologist Forum, Tutorials and Outreach Symposia

X40 Physical Sciences Tutorial: ABF STEM – Direct and Robust Atomic-resolution Imaging of Light Elements in Crystalline MaterialsTutorial

Abstract

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract