Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Real Structure and Structural Changes of Functional Tellurides

P12 Advanced Microanalysis and Microscopy of Soft and Hybrid Nanomaterials

Abstract

In Situ Electrochemical Deposition of Poly(3,4-ethylenedioxythiophene) (PEDOT)

Cryo-STEM Reveals Humidity-Controlled Shape Change in Silica Nanoparticles

Direct Conversion Biogas to Multiwall Carbon Nanotubes and Syngas over Starch Derived Ni@C Nanoparticles

The Biomineral-Cell Interface in the Sea Urchin Embryo

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Automated cryo electron tomography and sub-tomogram averaging with the FEI Volta phase plate

In situ studies of cellular architecture by Electron Cryo-Tomography with Volta Phase Plate

Applications and New Investigations of the Volta Phase Plate

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation

Probe Optimization studies For High current Focused Ion Beam Instruments

Methodology for Studying Nanoscale Details of Focused Ion Beam Gas-Assisted Etching and Deposition by TEM and Numerical Modeling

Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics

In situ Femtosecond Laser and Argon Ion Beams for 3D Microanalysis using the TriBeam

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Using Ultrafast X-ray Lasers to Image Structure & Dynamics

Studying Shocked Material Dynamics with Ultrafast X-rays

Imaging Irreversible Transformations with Movie-Mode Dynamic Transmission Electron Microscopy

Dynamic Transmission Electron Microscope Study on the Crystallization of Ion-Bombarded Amorphous Germanium Thin Films

A06 Advanced Analytical TEM/STEM

Abstract

Simultaneous High-Speed DualEELS and EDS acquisition at atomic level across the LaFeO3 / SrTiO3 interface

Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS

Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope

Microscopy and Microanalysis

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Volume 21 - August 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

P12 Advanced Microanalysis and Microscopy of Soft and Hybrid Nanomaterials

Abstract

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract