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Dynamic Transmission Electron Microscope Study on the Crystallization of Ion-Bombarded Amorphous Germanium Thin Films

Published online by Cambridge University Press:  23 September 2015

Tian T. Li
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
Melissa K. Santala
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
Leonardus Bimo Bayu Aji
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
Sergei O. Kucheyev
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
Huai-Yu M. Cheng
Affiliation:
IBM/Macronix PCRAM Joint Project, IBM T. J. Watson Research Center, Yorktown Heights, NY, USA
Geoffrey H. Campbell
Affiliation:
Materials Science Division, Lawrence Livermore National Laboratory, Livermore, CA, USA
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Abstract

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Copyright © Microscopy Society of America 2015 

References

[1] Haberl, B., et al, J. Appl. Phys. 110 (2011) 096104.CrossRefGoogle Scholar
[2] Campbell, G.H., McKeown, J.T. & Santala, M.K., Appl. Phys. Rev. 1 (2014) 041101.CrossRefGoogle Scholar
[3] This work was performed under the auspices of the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering for FWP SCW0974 by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344..Google Scholar
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