Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-30T11:41:32.634Z Has data issue: false hasContentIssue false
  • English
  • Français

Time-Resolved Imaging of Electrochemical Switching in Nanoscale Resistive Memory Elements

Published online by Cambridge University Press:  23 September 2015

William A. Hubbard ,
E. R. White ,
Alexander Kerelsky ,
G. Jasmin ,
Jared J. Lodico ,
Matthew Mecklenburg  and
B. C. Regan
William A. Hubbard
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
E. R. White
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
Alexander Kerelsky
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
G. Jasmin
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
Jared J. Lodico
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles,CA 90089 USA
B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California,Los Angeles, CA 90095 USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1911 - 1912
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Valov, I., et al, Nanotechnology 22 (2011). p 289502.Google Scholar
[2] Hubbard, W., et al, Microscopy and Microanalysis 20 (2014). p 1550–1551.Google Scholar
[3] Menzel, S., et al, Physical Chemistry Chemical Physics 20 (2013). p 6945.CrossRefGoogle Scholar
[4] This work has been supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, and by National Science Foundation award DMR-1206849. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA..Google Scholar