Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Zernike Phase Plate Configuration at Intermediate Lens Position on JEM2200FS

Zernike Cryo-EM with a Direct Electron Camera Enables Tracking Protein Conformations in the Temporal Dimension

A03 Electron Holography for Nanofields in Solids

Abstract

Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device

Three-Dimensional Magnetic Vortex Cores Visualized by Electron Holographic Vector Field Tomography

Towards Multiresolution Phase Retrieval using Electron Ptychography

Skyrmion Lattices Observed by High-Voltage Holography Electron Microscopes

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

Roles of self-assembly and beam damage in gas-assisted electron and ion beam induced processing

Site-Specific TEM Specimen Preparation of Samples with Sub-Surface Features

Micro-micromechanical Properties of Weld Metal

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Ultrafast Infrared Nanoscopy with Sub-Cycle Temporal Resolution

Lensless Imaging of Nano- and Meso-Scale Dynamics with X-rays

High-Resolution Phase-Contrast Imaging at XFELs

Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis

A06 Advanced Analytical TEM/STEM

Abstract

Analytical Electron Tomography: Methods and Applications

Multi-Dimensional Machine Learning Aided Analysis of a Nickel-Based Superalloy

Off-axis chromatic scanning confocal electron microscopy for inelastic imaging with atomic resolution

Depth Sensitivity of Atomic Resolution Aberration-Corrected Through-Focus STEM Imaging of Bi Dopants on Cu Grain Boundaries

Super-X XEDS STEM Tomography of y' Precipitates in the LSHR Nickel Superalloy

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

Nanoscale Mechanical Scattering Experiments towards the Local Analysis of Thermal Active Modes and Dispersion Interactions at Interfaces

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

A03 Electron Holography for Nanofields in Solids

Abstract

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract