Analytical and Instrumentation Science Symposia
A07 Scanning Probe Microscopy: New Methods and Applications
Abstract
High-Resolution Mapping of Quantitative Elastic Modulus of Polymers
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- 23 September 2015, pp. 2183-2184
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Environmental AFM as a Probe of the Morphology, Viscoelasticity and Lubricity of Crosslinked Hydrophilic Biomedical Coatings
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- 23 September 2015, pp. 2185-2186
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A New variable temperature solution-solid interface scanning tunneling microscope
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- 23 September 2015, pp. 2187-2188
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The power of confocal raman-AFM and raman-SEM (RISE) imaging in polymer research
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- 23 September 2015, pp. 2189-2190
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A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques
Abstract
Dedicated X-Ray mapping system with single and multiple SDD detectors for quantitative X-Ray mapping and data processing
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- 23 September 2015, pp. 2191-2192
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Quantitative Elemental Mapping with Electron Microprobe and Automated Data Analysis
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- 23 September 2015, pp. 2193-2194
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Homogeneity Testing of Microanalytical Reference Materials by Electron Probe Microanalysis
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- 23 September 2015, pp. 2195-2196
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A09 Advances in Combining Simulation and Experiment for Materials Design
Abstract
Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design
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- 23 September 2015, pp. 2197-2198
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Probing Complex Nanostructures by Combining Atomic-Scale Theory and Scanning Transmission Electron Microscopy
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- 23 September 2015, pp. 2199-2200
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Integrated Computational and Experimental Structure Determination for Nanoparticles
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- 23 September 2015, pp. 2201-2202
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Local Crystallography: Phases, Symmetries, and Defects from Bottom Up
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- 23 September 2015, pp. 2203-2204
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HAADF/MAADF Observations and Image Simulations of Dislocation Core Structures in a High Entropy Alloy
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- 23 September 2015, pp. 2205-2206
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Strain-Mediated Asymmetric Growth of Plasmonic Nanocrystals: A Monometallic Au Nanorod-Au Nanoparticle Heterodimer
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- 23 September 2015, pp. 2207-2208
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A10 Advances in Electron Diffraction and Automated Mapping Techniques
Abstract
Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution
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- 23 September 2015, pp. 2209-2210
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4D-STEM Imaging With the pnCCD (S)TEM-Camera
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- 23 September 2015, pp. 2211-2212
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GPU-Based Defect Image Simulations using the Scattering Matrix Formalism
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- 23 September 2015, pp. 2213-2214
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EBSD Surface Topography Determination in a Martensitic Au-Cu-Zn Alloy
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- 23 September 2015, pp. 2215-2216
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High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors
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- 23 September 2015, pp. 2217-2218
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A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS
Abstract
Nanoplasmonics in the TEM
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- 23 September 2015, pp. 2219-2220
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Real-space Imaging of Plasmonic Modes of Gold Tapers by EFTEM and EELS
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- 23 September 2015, pp. 2221-2222
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