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Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design

Published online by Cambridge University Press:  23 September 2015

Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford UK.
Katherine E. MacArthur
Affiliation:
Department of Materials, University of Oxford, Oxford UK.
Jolyon Aarons
Affiliation:
School of Chemistry, University of Southampton, Southampton, UK.
Chris-Kriton Skylaris
Affiliation:
School of Chemistry, University of Southampton, Southampton, UK.
Misbah Sarwar
Affiliation:
Johnson Matthey, Reading, UK.
Dogan Ozkaya
Affiliation:
Johnson Matthey, Reading, UK.
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford UK.
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Abstract

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Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lebeau, J. M. and Stemmer, S., Ultramicroscopy 108 (2008). p. 16531658.CrossRefGoogle Scholar
[2] S. Van Aert et at Nature 470 (2011). p. 374377.CrossRefGoogle ScholarPubMed
[3] Jones, L. et al., Nano Lett. 14 (2014).p. 63366341.CrossRefGoogle Scholar
[4] The authors acknowledge funding from EU FP7 grant 312483 (ESTEEM2), EPSRC grant EP/K040375/1 and Johnson Matthey, and S. VanAert and A. DeBacker for their useful discussions..Google Scholar
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