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Revealing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data
Published online by Cambridge University Press: 23 September 2015
Abstract
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- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2409 - 2410
- Copyright
- Copyright © Microscopy Society of America 2015
References
References:
[10] Work was funded by the Department of Energy, Basic Energy Sciences (DE-FG02-08ER46547).Google Scholar