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Revealing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data

Published online by Cambridge University Press:  23 September 2015

Andrew B. Yankovich
Affiliation:
Dept. of Materials Science and Engineering, University of Wisconsin, Madison, WI 53706, USA.
Jie Feng
Affiliation:
Dept. of Materials Science and Engineering, University of Wisconsin, Madison, WI 53706, USA.
Alex Kvit
Affiliation:
Dept. of Materials Science and Engineering, University of Wisconsin, Madison, WI 53706, USA.
Thomas Slater
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK.
Sarah Haigh
Affiliation:
School of Materials, University of Manchester, Manchester, M13 9PL, UK.
Dane Morgan
Affiliation:
Dept. of Materials Science and Engineering, University of Wisconsin, Madison, WI 53706, USA.
Paul M. Voyles
Affiliation:
Dept. of Materials Science and Engineering, University of Wisconsin, Madison, WI 53706, USA.
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Abstract

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Copyright © Microscopy Society of America 2015 

References

[1] Berkels, , et al., Ultramicroscopy 138, 46 (2013).CrossRefGoogle Scholar
[2] Yankovich, , et al., Nature Communications 5, 4155 (2014).CrossRefGoogle Scholar
[3] Sang, , et al., Ultramicroscopy 138, 2835 (2014).CrossRefGoogle Scholar
[4] Yankovich, , et al. Advanced Structural and Chemical Imaging, accepted 2015.Google Scholar
[5] LeBeau, , et al., Nano Letters 10, 4405 (2010).CrossRefGoogle Scholar
[6] Jia, , et al., Nature Materials 13, 1044 (2014).CrossRefGoogle Scholar
[7] Voyles, , et al., Nature 416, 826 (2002).CrossRefGoogle Scholar
[8] Hwang, , et al., PRL 111(no. 26), 266101 (2013).CrossRefGoogle Scholar
[9] Azough, , et al., Chemistry of Materials 27(2), 497 (2015).CrossRefGoogle Scholar
[10] Work was funded by the Department of Energy, Basic Energy Sciences (DE-FG02-08ER46547).Google Scholar
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