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24 results

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The Cambridge Grammar of the English Language
  • Rodney Huddleston, Geoffrey K. Pullum
  • In collaboration with Laurie Bauer, Betty Birner, Ted Briscoe, Peter Collins, David Denison, David Lee, Anita Mittwoch, Geoffrey Nunberg, Frank Palmer, John Payne, Peter Peterson, Lesley Stirling, Gregory Ward
  • Published online:
    26 May 2017
    Print publication:
    15 April 2002
  • This book presents a new and comprehensive descriptive grammar of English, written by the principal authors in collaboration with an international research team of a dozen linguists in five countries. It represents a major advance over previous grammars by virtue of drawing systematically on the linguistic research carried out on English during the last forty years. It incorporates insights from the theoretical literature but presents them in a way that is accessible to readers without formal training in linguistics. It is based on a sounder and more consistent descriptive framework than previous large-scale grammars, and includes much more explanation of grammatical terms and concepts, together with justification for the ways in which the analysis differs from traditional grammar. The book contains twenty chapters and a guide to further reading. Its usefulness is enhanced by diagrams of sentence structure, cross-references between sections, a comprehensive index, and user-friendly design and typography throughout.

  • Composition Quantification of Microelectronics Multilayer Thin Films by EDX: Toward Small Scale Analysis

  • Thierry Conard, Kai Arstila, Thomas Hantschel, Alexis Franquet, Wilfried Vandervorst, Emma Vecchio, Simon Burgess, Frank Bauer
  • Journal:
    MRS Online Proceedings Library Archive / Volume 1184 / 2009
    Published online by Cambridge University Press:
    31 January 2011, 1184-HH08-08
    Print publication:
    2009

  • In order to continuously improve the performances of microelectronics devices through scaling, SiO2 is being replaced by high-k materials as gate dielectric; metal gates are replacing poly-Si. This leads to increasingly more complex stacks. For future generations, the replacement of Si as a substrate by Ge and/or III/V material is also considered. This also increases the demand on the metrology tools as a thorough characterization, including composition and thickness is thus needed. Many different techniques exist for composition analysis. They usually require however large area for the analysis, complex instrumentation and can be time consuming. EDS (Energy Dispersive Spectroscopy) when coupled to Scanning Electron Microscopy (SEM) has the potential to allow fast analysis on small scale areas.

    In this work, we evaluate the possibilities of EDS for thin film analysis based on an intercomparison of composition analysis with different techniques. We show that using proper modeling, high quality quantitative composition and thickness of multilayers can be achieved.

  • Regularization without preliminary knowledge of smoothness and error behaviour

  • FRANK BAUER, SERGEI PEREVERZEV
  • Journal:
    European Journal of Applied Mathematics / Volume 16 / Issue 3 / June 2005
    Published online by Cambridge University Press:
    20 July 2005, pp. 303-317

  • The mathematical formulation of many physical problems results in the task of inverting a compact operator. The only known sensible solution technique is regularization which poses a severe problem in itself. Classically one dealt with deterministic noise models and required the knowledge of smoothness of the solution or the overall error behaviour. We will show that we can guarantee an asymptotically almost optimal regularization for a physically motivated noise model under no assumptions for the smoothness and rather weak assumptions on the noise behaviour. An application to the determination of the gravitational field out of satellite data will be shown.

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