11 results
Defects in Low-k Insulators (κ=2.5 – 2.0): ESR Analysis and Charge Injection
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1335 / 2011
- Published online by Cambridge University Press:
- 18 August 2011, mrss11-1335-o04-04
- Print publication:
- 2011
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Probing Semiconductor/Insulator Heterostructures Through Electron Spin Resonance of Point Defects: Interfaces, Interlayers, and Stress
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- Journal:
- MRS Online Proceedings Library Archive / Volume 984 / 2006
- Published online by Cambridge University Press:
- 26 February 2011, 0984-MM08-01
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- 2006
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Influence of the Distribution of Tail States in a-Si:H on the Field Dependence of Carrier Drift Mobilities
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- Journal:
- MRS Online Proceedings Library Archive / Volume 808 / 2004
- Published online by Cambridge University Press:
- 21 March 2011, A5.6
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- 2004
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Electron Spin Resonance Characterization of Defects at Interfaces in Stacks of Ultrathin High-κ Dielectric Layers on Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E1.4
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- 2003
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Microcharacterization of Defects Induced in Fused Silica by High Power 3ω UV (355nm) Laser Pulses
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 496-497
- Print publication:
- August 2001
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Correlation Between Development of Leakage Current and Hydrogen Ionization in Ultrathin Silicon Dioxide Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 592 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 195
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- 1999
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Characterization of the Pb1 Interface Defect in Thermal (100)Si/SiO2 by Electron Spin Resonance: 29Si Hyperfine Structure and Electrical Relevance
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- Journal:
- MRS Online Proceedings Library Archive / Volume 592 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 21
- Print publication:
- 1999
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Low Temperature Anneal of the Divacancy in P-Type Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 953
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- 1995
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Localization and Electric-Field Modulated Electron Spin Resonance of a Shallow Donor in Simox
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- Journal:
- MRS Online Proceedings Library Archive / Volume 284 / 1992
- Published online by Cambridge University Press:
- 22 February 2011, 573
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- 1992
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Depth Profiling of Oxygen Vacancy Defect Generation in Buried SiO2
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- Journal:
- MRS Online Proceedings Library Archive / Volume 284 / 1992
- Published online by Cambridge University Press:
- 22 February 2011, 299
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- 1992
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Hydrogen incorporation mechanisms in the preparation of a-Si:H by ion bombardment-activated reactive evaporation
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- Journal:
- Journal of Materials Research / Volume 3 / Issue 2 / April 1988
- Published online by Cambridge University Press:
- 31 January 2011, pp. 335-343
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- April 1988
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