15 results
Standard Methods and Reference Materials for Performing a Complete EPMA WDS Instrument Diagnostic
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2237-2238
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- August 2015
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EPMA WDS Quality Assurance: Materials and Methods
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 732-733
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- August 2014
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Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)
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- Microscopy and Microanalysis / Volume 16 / Issue 1 / February 2010
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- 24 December 2009, pp. 1-12
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- February 2010
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Quantitative Electron Probe Microanalysis of Si-Ge Reference Materials
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 1312-1313
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- August 2005
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A New NIST SRM® for Microanalysis and X-ray Fluorescence, TiAl(NbW) Alloy
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 926-927
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- August 2004
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NIST Certification of Metallurgical Standard Reference Materials for Microanalysis - A Short History
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 01 August 2003, pp. 714-715
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- August 2003
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A Simple Method For Determining Optimum Corrections For High-Accuracy Epma In Difficult Chemical Systems
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 438-439
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- August 2002
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Chemical Characterization of Silicon-Germanium Single Crystals – Initial Evaluation of the Extent of Heterogeneity
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1490-1491
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- August 2002
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Evaluation of a Lead Lanthanum Zirconium Titanate (Plzt) Specimen for Use as an Electron Microprobe Reference Material
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 680-681
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- August 2001
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Useful Lead and Bismuth Standards for Quantitative Electron Probe Microanalysis
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 934-935
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- August 2000
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Microstructural Characterization of Yttria-Doped Zirconia Coatings with Electron Microprobe Wavelength Dispersive Compositional Mapping
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- Journal:
- MRS Online Proceedings Library Archive / Volume 645 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, M9.7.1
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- 2000
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Phase Identification in Heated Thermal Barrier Coatings using Microbeam X-ray Diffraction Combined with Quantitative X-ray Mapping
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- MRS Online Proceedings Library Archive / Volume 645 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, MM8.4.1
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- 2000
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Electron Probe Evaluation of Heterogeneity in the Certification of NIST Standard Reference Materials for Microanalysis
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 242-243
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- July 1998
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Quality Assurance of Energy Dispersive Spectrometry Systems
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 214-215
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- July 1998
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Quality Assurance of Energy Dispersive Spectrometry Systems
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 903-904
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- August 1997
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