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Quantitative Electron Probe Microanalysis of Si-Ge Reference Materials

Published online by Cambridge University Press:  01 August 2005

R B Marinenko ,
S Turner ,
D E Newbury ,
L Richter ,
L Yu ,
R Zeisler  and
D Simons
R B Marinenko
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
S Turner
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
D E Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
L Richter
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
L Yu
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
R Zeisler
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
D Simons
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1312 - 1313
Copyright
© 2005 Microscopy Society of America