Hostname: page-component-77c89778f8-m42fx Total loading time: 0 Render date: 2024-07-20T00:00:14.605Z Has data issue: false hasContentIssue false

Quality Assurance of Energy Dispersive Spectrometry Systems

Published online by Cambridge University Press:  02 July 2020

E. B. Steel
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899
R. B. Marinenko
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899
Get access

Extract

Monitoring the performance and capabilities of energy dispersive X-ray spectrometers (EDS) and related x-ray analysis electronics and software is important for maintaining and improving the reliability, sensitivity, and accuracy of the x-ray analysis system. There is growing demand for quality systems through laboratory accreditation, ISO 9000, ISO Guide 25 and related programs that require set quality control procedures for analytical instrumentation. In such cases it is frequently more useful to have one national/international standard. This approach is not only more efficient than having each analyst devise their own system, but the use of the same standard procedures among labs would allow direct intercomparison of results. This intercomparison can help labs and manufacturers determine what are normal versus abnormal results and lead to higher quality instruments and analyses.

We are designing a standard procedure to maximize the efficiency of each quality control (QC) measurement so that we spend as little time monitoring the analysis system as is possible.

Type
30 Years of Energy Dispersive Spectrometry in Microanalysis
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Certificate of Analysis SRM 482: Gold-Copper Wires for Microprobe Analysis, NIST, Gaithersburg, MD, 20899.Google Scholar
2. Certificate of Analysis SRM 2063a: Microanalysis Thin Film Mg-Si-Ca-Fe-0 glass, NIST, Gaithersburg, MD, 20899.Google Scholar
3.Myklebust, R.L et al., in Microbeam Analysis-1990, New York:Plenum (1990)147.Google Scholar