No CrossRef data available.
Article contents
Microstructural Characterization of Yttria-Doped Zirconia Coatings with Electron Microprobe Wavelength Dispersive Compositional Mapping
Published online by Cambridge University Press: 17 March 2011
Abstract
The use of digital electron microprobe x-ray compositional mapping with wavelength dispersive spectrometers to understand the microstructure of yttria stabilized zirconia thermal barrier coatings is described. Data from quantification of element x-ray maps can be utilized to infer what phase or phases are present. Analysis of a plasma-sprayed coating prepared from a fused and crushed feedstock is compared to an annealed specimen of the same material.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 2001