14 results
SEM EDS Mapping of Ultra-Low Energy X-rays Using a Silicon Nitride Window Silicon Drift Detector
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 572-573
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- August 2022
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The Detector Efficiency Question with EDS
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1674-1676
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- August 2021
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EDS Quantification Using Fe L Peaks and Low Beam Energy
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1670-1672
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- August 2021
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Mitigating Shadowing and Topographic Artifacts Using Dual EDS Detectors
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1578-1580
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- August 2021
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Strategies for Multimodal Analysis of Joint EELS and EDS Data
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1070-1073
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- August 2021
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Standard-less Quantification and Standard Customized Coefficients
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2174-2175
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- August 2020
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Alignment Considerations for Precise Large Area Imaging and EDS Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1260-1262
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- August 2020
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Quantification and Precision in Particle Analysis Using SEM and EDS
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 708-709
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- August 2019
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Understanding the Possible Links Between Grain Boundary Morphology and Mineralogy in the Sericho Pallasite
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2114-2115
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- August 2018
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EDS and VP-SEM: Practical Considerations and Challenges
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 684-685
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- August 2018
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Silicon Drift Detectors: Limitations for Throughput and Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 50-51
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- July 2017
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Correlating Complementary Data for Improving Electron Backscatter Diffraction (EBSD) Microstructural Characterization of Geological Materials
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2166-2167
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- July 2017
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Improvements in SDD Efficiency – From X-ray Counts to Data
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- Journal:
- Microscopy Today / Volume 25 / Issue 2 / March 2017
- Published online by Cambridge University Press:
- 06 March 2017, pp. 46-53
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- March 2017
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EDS Windows and Plasma Cleaning: Characterization and Damage Mechanisms
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 638-639
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- July 2016
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