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The Detector Efficiency Question with EDS

Published online by Cambridge University Press:  30 July 2021

Frank Eggert ,
Jens Rafaelsen ,
Felix Reinauer ,
Patrick Camus  and
Ulrich Gernert
Frank Eggert
Affiliation:
Ametek / EDAX LLC, Mahwah, New Jersey, United States
Jens Rafaelsen
Affiliation:
Ametek / EDAX LLC, Mahwah, New Jersey, United States
Felix Reinauer
Affiliation:
Ametek / EDAX LLC, Mahwah, New Jersey, United States
Patrick Camus
Affiliation:
Ametek / EDAX LLC, Mahwah, New Jersey, United States
Ulrich Gernert
Affiliation:
Technische Universität Berlin, Center f. El. Micr. (ZELMI), Berlin, Berlin, Germany

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1674 - 1676
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Camus, P P, Microsc. Microanal. 23 (2017) 1064CrossRefGoogle Scholar
EDAX Technical Note (2014)Google Scholar
Törmä, P T et al. IEEE Transact. On Nuclear Science 61 (2014) 695CrossRefGoogle Scholar
Scholze, F, Procop, M, X-Ray Spectrom. 34 (2005) 473CrossRefGoogle Scholar
Alvisi, M et al. , Microsc. Microanal. 12 (2006) 406CrossRefGoogle Scholar