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Quantification and Precision in Particle Analysis Using SEM and EDS

Published online by Cambridge University Press:  05 August 2019

Shangshang Mu  and
Jens Rafaelsen
Shangshang Mu*
Affiliation:
EDAX Inc, A Division of Ametek, Materials Analysis Division, Mahwah, NJ, USA
Jens Rafaelsen
Affiliation:
EDAX Inc, A Division of Ametek, Materials Analysis Division, Mahwah, NJ, USA
*
*Corresponding author: Shangshang.mu@ametek.com

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 708 - 709
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Laskin, A and Cowin, JP, Analytical Chemistry 73 (2001), p.1023.Google Scholar
[2]Laskin, A et al. , 2006, Journal of Electron Spectroscopy and Related Phenomena, 2-3 (2006), p. 260.Google Scholar
[3]Heinrich, KFJ in “X-ray Spectrometry in Electron Beam Instruments”, ed. Williams, DB et al. , (Springer, Boston), p. 305.Google Scholar