Hostname: page-component-84b7d79bbc-tsvsl Total loading time: 0 Render date: 2024-07-25T08:39:50.615Z Has data issue: false hasContentIssue false
  • English
  • Français

Silicon Drift Detectors: Limitations for Throughput and Resolution

Published online by Cambridge University Press:  04 August 2017

Jens Rafaelsen
Jens Rafaelsen*
Affiliation:
EDAX Inc, A Division of Ametek, Materials Analysis Division, Mahwah, NJ

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 50 - 51
Copyright
© Microscopy Society of America 2017 

References

[1] Struder, L., et al, Mikrochimica Acta, Supplement 15 1998). p 11.Google Scholar
[2] Fiorini, L. B. C., et al IEEE Nuclear Science Symposium Conference Record (2011) p. 1972.Google Scholar