12 results
Helios 5 – New Generation DualBeam Technology for Materials Science
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 524-525
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- August 2019
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Delusion proneness and ‘jumping to conclusions’: relative and absolute effects
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- Psychological Medicine / Volume 45 / Issue 6 / April 2015
- Published online by Cambridge University Press:
- 30 September 2014, pp. 1253-1262
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Thickness Variations and Absence of Lateral Compositional Fluctuations in Aberration-Corrected STEM Images of InGaN LED Active Regions at Low Dose
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 26 March 2014, pp. 864-868
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- June 2014
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Xe+ FIB Milling and Measurement of Amorphous Silicon Damage
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 862-863
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- August 2013
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Advances in S/TEM Sample Preparation Using a FIB-SEM: Techniques for the Ultimate Sample
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 868-869
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- August 2013
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Three-Dimensional Analysis of Microbial Communities
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 388-389
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- July 2010
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Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 336-337
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- July 2009
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Advances in TEM Sample Preparation Using a Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 380-381
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- August 2008
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Evidence for a Critical Amorphization Thickness Limit of Ga+ Ion Bombardment in Si
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1516-1517
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- August 2007
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Static vs. Dynamic FIB/SEM Methods For 3D Modeling
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1506-1507
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- August 2007
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Minimization of Ga Induced FIB Damage Using Low Energy Clean-up
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1736-1737
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- August 2006
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Looking Backward, Looking Forward: MLA Members Speak
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- PMLA / Publications of the Modern Language Association of America / Volume 115 / Issue 7 / December 2000
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- 23 October 2020, pp. 1986-2078
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- December 2000
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